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dc.contributor.authorTuttle, John Randall
dc.date.accessioned2012-11-30T18:33:05Z
dc.date.available2012-11-30T18:33:05Z
dc.date.issued2012-11-30
dc.date.submittedMay 1984
dc.identifier.urihttp://hdl.handle.net/1928/21645
dc.description.abstractThe thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.en_US
dc.language.isoen_USen_US
dc.subjectCircuitsen_US
dc.subjectSmall Angle Measurement Deviceen_US
dc.titleAn Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflectionsen_US
dc.typeThesisen_US
dc.description.degreeElectrical and Computer Engineeringen_US
dc.description.levelMastersen_US
dc.description.departmentUniversity of New Mexico. Dept. of Electrical and Computer Engineeringen_US
dc.description.advisorKarni
dc.description.committee-memberJamshad
dc.description.committee-memberHawkins


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