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dc.contributor.authorTuttle, John Randall
dc.date.accessioned2012-11-30T18:33:05Z
dc.date.available2012-11-30T18:33:05Z
dc.date.issued2012-11-30
dc.date.submittedMay 1984
dc.identifier.urihttp://hdl.handle.net/1928/21645
dc.description.abstractThe thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.en_US
dc.language.isoen_USen_US
dc.subjectCircuitsen_US
dc.subjectSmall Angle Measurement Deviceen_US
dc.titleAn Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflectionsen_US
dc.typeThesisen_US
dc.description.degreeElectrical and Computer Engineeringen_US
dc.description.levelMastersen_US
dc.description.departmentUniversity of New Mexico. Dept. of Electrical and Computer Engineeringen_US
dc.description.advisorKarni
dc.description.committee-memberJamshad
dc.description.committee-memberHawkins
dc.data.json{ "@context": { "rdf": "http://www.w3.org/1999/02/22-rdf-syntax-ns#", "rdfs": "http://www.w3.org/2000/01/rdf-schema#", "xsd": "http://www.w3.org/2001/XMLSchema#" }, "@graph": [ { "@id": "http://54.191.234.158/entities/resource/Circuits", "@type": "http://schema.org/Intangible" }, { "@id": "http://hdl.handle.net/1928/21645", "@type": "http://schema.org/CreativeWork", "http://purl.org/montana-state/library/associatedDepartment": { "@id": "http://54.191.234.158/entities/resource/University_of_New_Mexico.__Dept._of_Electrical_and_Computer_Engineering" }, "http://purl.org/montana-state/library/degreeGrantedForCompletion": "Electrical and Computer Engineering", "http://purl.org/montana-state/library/hasEtdCommitee": { "@id": "http://54.191.234.158/entities/resource/1928/21645" }, "http://schema.org/about": [ { "@id": "http://54.191.234.158/entities/resource/Circuits" }, { "@id": "http://54.191.234.158/entities/resource/Small_Angle_Measurement_Device" } ], "http://schema.org/author": { "@id": "http://54.191.234.158/entities/resource/Tuttle_John_Randall" }, "http://schema.org/dateCreated": "May 1984", "http://schema.org/datePublished": "2012-11-30", "http://schema.org/description": "The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.", "http://schema.org/inLanguage": "en_US", "http://schema.org/isPartOf": { "@id": "http://hdl.handle.net/1928/10631" }, "http://schema.org/name": "An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections" }, { "@id": "http://54.191.234.158/entities/resource/Tuttle_John_Randall", "@type": "http://schema.org/Person" }, { "@id": "http://54.191.234.158/entities/resource/Small_Angle_Measurement_Device", "@type": "http://schema.org/Intangible" }, { "@id": "http://hdl.handle.net/1928/10631", "@type": "http://schema.org/WebSite" } ]}


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