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An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1928/21645

An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections

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dc.contributor.author Tuttle, John Randall
dc.date.accessioned 2012-11-30T18:33:05Z
dc.date.available 2012-11-30T18:33:05Z
dc.date.issued 2012-11-30
dc.date.submitted May 1984
dc.identifier.uri http://hdl.handle.net/1928/21645
dc.description.abstract The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached. en_US
dc.language.iso en_US en_US
dc.subject Circuits en_US
dc.subject Small Angle Measurement Device en_US
dc.title An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections en_US
dc.type Thesis en_US
dc.description.degree Electrical and Computer Engineering en_US
dc.description.level Masters en_US
dc.description.department University of New Mexico. Dept. of Electrical and Computer Engineering en_US
dc.description.advisor Karni
dc.description.committee-member Jamshad
dc.description.committee-member Hawkins


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