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An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1928/21645

An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections

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Title: An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections
Author: Tuttle, John Randall
Advisor(s): Karni
Committee Member(s): Jamshad
Hawkins
Department: University of New Mexico. Dept. of Electrical and Computer Engineering
Subject(s): Circuits
Small Angle Measurement Device
Degree Level: Masters
Abstract: The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.
Graduation Date: May 1984
URI: http://hdl.handle.net/1928/21645

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Thesis Tuttle John.pdf 39.47Mb PDF View/Open
Thesis-2.pdf 39.40Mb PDF View/Open

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