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Characterizing within-die and die-to-die delay variations introduced By process variations and SOI history effect

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1928/12832

Characterizing within-die and die-to-die delay variations introduced By process variations and SOI history effect

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dc.contributor.author Aarestad, James
dc.date.accessioned 2011-07-02T15:27:44Z
dc.date.available 2011-07-02T15:27:44Z
dc.date.issued 2011-07-02
dc.date.submitted May 2011
dc.identifier.uri http://hdl.handle.net/1928/12832
dc.description.abstract Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation techniques to reduce the detrimental effects of delay variations, particularly those that occur within-die, new methods of measuring delay variations within actual products are needed. The data provided by such techniques can also be used for validating models, i.e., can assist with model-to-hardware correlation. In this research work, a method is proposed for a flush delay technique to measure both regional delay variations and SOI history effect. The method is then validated using a test structure fabricated in a 65 nm SOI process. en_US
dc.description.sponsorship National Science Foundation en_US
dc.language.iso en_US en_US
dc.subject Delay variation en_US
dc.subject Regional Delay Variation en_US
dc.subject SOI History Effect en_US
dc.subject Process Variation en_US
dc.subject.lcsh Delay faults (Semiconductors)
dc.subject.lcsh Silicon-on-insulator technology.
dc.title Characterizing within-die and die-to-die delay variations introduced By process variations and SOI history effect en_US
dc.type Thesis en_US
dc.description.degree Computer Engineering en_US
dc.description.level Masters en_US
dc.description.department University of New Mexico. Dept. of Electrical and Computer Engineering en_US
dc.description.advisor Plusquellic, Jim
dc.description.committee-member Plusquellic, Jim
dc.description.committee-member Zarkesh-Ha, Payman
dc.description.committee-member Pattichis, Marios


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