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Characterizing within-die and die-to-die delay variations introduced By process variations and SOI history effect
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation techniques to reduce the detrimental effects ...
A hardware-embedded, delay-based PUF engine designed for use in cryptographic and authentication applications
Cryptographic and authentication applications in application-specific integrated circuits (ASICs) and field-programmable gate arrays (FPGAs), as well as codes for the activation of on-chip features, require the use of ...