An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections

Author

John Randall Tuttle

Publication Date

11-30-2012

Abstract

The thesis problem was to design, construct, test and evaluate an opto-electronic detector subsystem for use in the Small Angle Measurement Device (SAMD) system. The SAMD measures the ultra-small angular deflection (bending) of the substrate to which it is attached.

Document Type

Thesis

Language

English

Degree Name

Electrical Engineering

Level of Degree

Masters

Department Name

Electrical and Computer Engineering

First Committee Member (Chair)

Hawkins

Recommended Citation

Tuttle, John Randall. "An Optoelectronic Detector Circuit for Measuring Ultra-Small Angular Deflections." (2012). https://digitalrepository.unm.edu/ece_etds/254