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Nonlinear microscopy for material characterization

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Please use this identifier to cite or link to this item: http://hdl.handle.net/1928/10312

Nonlinear microscopy for material characterization

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dc.contributor.author Weber, Reed Alan
dc.date.accessioned 2010-02-09T21:11:53Z
dc.date.available 2010-02-09T21:11:53Z
dc.date.issued 2010-02-09T21:11:53Z
dc.identifier.uri http://hdl.handle.net/1928/10312
dc.description.abstract Making use of femtosecond laser sources, nonlinear microscopy exhibits inherent 3- dimensional optical sectioning and provides access to previously unstudied aspects of materials. By probing third order nonlinear optical signals determined by the nonlinear susceptibility (chi-3), which is present in all materials, we gain insight not available by conventional linear or electron microscopy. Third-harmonic generation (THG) and four-wave mixing (FWM) microscopy are used to investigate fundamental material parameters. THG microscopy is applied to supplement damage studies of optical coatings by imaging laser induced material modification both above and below damage threshold conditions in HfO2 thin-films. FWM microscopy is employed to investigate FWM signals and implied finite response times in multiple substrates. en_US
dc.language.iso en_US en_US
dc.subject nonlinear optics en_US
dc.subject microscopy en_US
dc.subject femtosecond pulse en_US
dc.subject thin film damage studies en_US
dc.subject third-harmonic generation en_US
dc.subject four-wave mixing en_US
dc.subject.lcsh Nonlinear optics.
dc.subject.lcsh Microscopy. Materials--Analysis. Optical coatings--Effect of radiation on.
dc.subject.lcsh Femtosecond lasers.
dc.subject.lcsh Semiconductors--Characterization.
dc.subject.lcsh Optical coatings--Effect of radiation on.
dc.subject.lcsh Hafnium oxide.
dc.subject.lcsh Polymethylmethacrylate--Analysis.
dc.subject.lcsh Silica, Vitreous--Analysis.
dc.subject.lcsh Corundum--Analysis.
dc.title Nonlinear microscopy for material characterization en_US
dc.type Thesis en_US


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